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This paper proposes the preliminary study of the data-driven failure analysismodel for the internet of things (IoT) devices. This model focus on the impactof data transferring both get and receiving data in class C of Low Power WideArea Network (LoRaWAN). To set up the network, the authors develop thecombination of four several technology parts, including 1) the End DeviceGateway Network server of LoRa IoT, 2) an Application server for storing thedata in the database, 3) the Dashboard to show and got the command by the user,and 4) the failure analysis model based on Bayesian belief networks whichcalculate the probability values that collect the data transferring both uplinkand downlink on the network connection in this study. In the testing phase, theauthors input the separated data into the data-driven failure analysis model toanalyze the time and latency of the connection by the concern of the impact andrisk of the failure of the overall system. The model will show the probabilityvalue of failure. The authors hope to use the results to clarify whether atested IoT device is suitable for use or not.

Data-Driven Model for Failure Analysis of Internet of Things Devices: A Preliminary Study