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In our previous publication, we discussed the optical properties ofmulti-layered nanocomposite samples consisting of 300 pairs of an AlOx layerand a Cu layer produced from sputtering atomic layer augmented deposition(SALAD). These samples displayed unusual spectral reflectance that could not bewell described via conventional means and could not be explained as aninterpolation of the constituent materials. Computational models were thenneeded to both describe the results that were obtained and to predict thesamples' other material properties. This process was approached by using thetransfer-matrix method to describe the spectral reflectance based on theconstituent materials, and then the dispersion method was used to find thecomposite index of refraction for the samples. The models successfullydescribed pure Cu but encountered minor difficulties when it came to AlOx, assuch, more research is needed to either properly model non-holomorphicmaterials like AlOx with the current algorithm or to find a better model thatcan adequately describe both Cu and AlOx. The dispersion model implementedpredicts that the samples, composed of many thin film layers of metal anddielectric, would display semiconductor-like behavior. Therefore, thisindicates that SALAD's combination of sputtering and ALD permits the generationof novel metal-dielectric based semiconductors.

Semiconductor-like Optical Properties Unveiled by Modeling of  Short-Period Aluminum Oxide-Copper Multi-Layered Nanocomposites Deposited by  Sputtering Atomic Layer Augmented Deposition (SALAD)