English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Tools annual

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Presents the access of premium content as premium feature

Premium Content

Global: Zendy Plus annual

Global: Zendy Free Plan

One-shot devices data represent an extreme case of interval censoring.Somekind of one-shot units do not get destroyed when tested, and so, survival unitscan continue within the test providing extra information about their lifetime.Moreover, one-shot devices may last for long times under normal operatingconditions, and so accelerated life tests (ALTs) may be used for inference.ALTs relate the lifetime distribution of an unit with the stress level at whichit is tested via log-linear relationship.Then, mean lifetime of the devices arereduced during the test by increasing the stress level and inference results onincreased stress levels can be easily extrapolated to normal operatingconditions. In particular, the step-stress ALT model increases the stress levelat pre-fixed times gradually during the life-testing experiment, which may bespecially advantageous for non-destructive one-shot devices. However, when thenumber of units under test are few, outlying data may greatly influence theparameter estimation. In this paper, we develop robust restricted estimatorsbased on the density power divergence (DPD) under linearly restrictedsubspaces, for non-destructive one-shot devices under the step-stress ALTs withexponential lifetime distributions. We theoretically study the asymptotic androbustness properties of the restricted estimators and we empiricallyillustrate such properties through a simulation study.

The restricted minimum density power divergence estimator for  non-destructive one-shot device testing the under step-stress model with  exponential lifetimes