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The need of mathematically formulate relations between composite materials'properties and its resonance response is growing. This is due the fasttechnological advancement in micro-material manufacturing, present in chips forinstance. In this paper two theorems are presented, providing formulas ofscattering resonance of double-layered and multilayered small volumes in termsof the coefficient of susceptibility, being high, and the geometriccharacteristics. Spectroscopy measurements of the composite medium can exploitthe formula to detect its dimension and susceptibility index.

Theorem of resonance of Small Volume High Contrast multilayered materials