English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

One-shot devices analysis involves an extreme case of interval censoring,wherein one can only know whether the failure time is either before or afterthe test time. Some kind of one-shot devices do not get destroyed when tested,and so can continue within the experiment, providing extra information forinference, if they did not fail before an inspection time. In addition, theirreliability can be rapidly estimated via accelerated life tests (ALTs) byrunning the tests at varying and higher stress levels than working conditions.In particular, step-stress tests allow the experimenter to increase the stresslevels at pre-fixed times gradually during the life-testing experiment. Thecumulative exposure model is commonly assumed for step-stress models, relatingthe lifetime distribution of units at one stress level to the lifetimedistributions at preceding stress levels. In this paper,vwe develop robustestimators and Z-type test statistics based on the density power divergence(DPD) for testing linear null hypothesis for non-destructive one-shot devicesunder the step-stress ALTs with exponential lifetime distribution. We studyasymptotic and robustness properties of the estimators and test statistics,yielding point estimation and confidence intervals for different lifetimecharacteristic such as reliability, distribution quantiles and mean lifetime ofthe devices. A simulation study is carried out to assess the performance of themethods of inference developed here and some real-life data sets are analyzedfinally for illustrative purpose.

Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes