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Transition metal dichalcogenides (TMDs) attract significant attention due totheir exceptional optical and excitonic properties. It was understood alreadyin the 1960s, and recently rediscovered, that many TMDs possess high refractiveindex and optical anisotropy, which make them attractive for nanophotonicapplications. However, accurate analysis and predictions of nanoopticalphenomena require knowledge of dielectric constants along both in- andout-of-plane directions and over a broad spectral range -- information, whichis often inaccessible or incomplete. Here, we present an experimental study ofoptical constants from several exfoliated TMD multilayers obtained usingspectroscopic ellipsometry in the broad range of 300--1700 nm. The specificmaterials studied include semiconducting WS$_2$, WSe$_2$, MoS$_2$, MoSe$_2$,MoTe$_2$, as well as, in-plane anisotropic ReS$_2$, WTe$_2$, and metallicTaS$_2$, TaSe$_2$, and NbSe$_2$. The extracted parameters demonstratehigh-index ($n$ up till $\approx 4.84$ for MoTe$_2$), significant anisotropy($n_{\parallel}-n_{\perp} \approx 1.54$ for MoTe$_2$), and low absorption inthe near infrared region. Moreover, metallic TMDs show potential for combinedplasmonic-dielectric behavior and hyperbolicity, as their plasma frequencyoccurs at around $\sim$1000--1300 nm depending on the material. The knowledgeof optical constants of these materials opens new experimental andcomputational possibilities for further development of all-TMD nanophotonics.

Optical constants of several multilayer transition metal dichalcogenides  measured by spectroscopic ellipsometry in the 300-1700 nm range: high-index,  anisotropy, and hyperbolicity