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Nonlinear frequency conversion provides an elegant method to detect photonsin a spectral range which differs from the pump wavelength, making it highlyattractive for photons with inherently low energy. Aside from the intensity ofthe light, represented by the number of photons, their phase provides importantinformation and enables a plethora of applications. We present aphase-sensitive measurement method in the terahertz spectral range by onlydetecting visible light. Using the optical interference of frequency-convertedphotons and leftover pump photons of the involved ultrashort pulses, fastdetermination of layer-thicknesses is demonstrated. The new method enablesphase-resolved detection of terahertz pulses using standard sCMOS equipmentwhile achieving sample measurement times of less than one second with aprecision error of less than 0.6%.

Sample thickness measurements by phase-sensitive terahertz upconversion detection