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X-ray diffraction with high spatial resolution is commonly used tocharacterize (poly-)crystalline samples with, for example, respect to localstrain, residual stress, grain boundaries and texture. However, theinvestigation of highly absorbing samples or the simultaneous assessment ofhigh-Z materials by X-ray fluorescence have been limited due to the utilisationof low photon energies. Here, we report on a goniometer-based setup implementedat the P06 beamline of PETRA III that allows for micrometer spatial resolutionwith a photon energy of 35 keV and above. A highly focused beam was achieved byusing compound refractive lenses and high precision sample manipulation wasenabled by a goniometer that allows for up to 5D scans (3 rotations & 2translations). As experimental examples, we demonstrate the determination oflocal strain variations in martensitic steel samples with micrometer spatialresolution as well as the simultaneous elemental distribution for high-Zmaterials in a thin film solar cell. Our proposed approach allows users fromthe materials science community to determine micro-structural properties evenin highly absorbing samples.

X-ray diffraction with micrometer spatial resolution for highly absorbing samples