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We obtained a semi-analytical treatment obtaining estimators for the samplevariance and variance of sample variance for the RTS noise. Our method suggestsa way to experimentally determine the constants of capture and emission in thecase of a dominant trap and universal behaviors for the superposition from manytraps. We present detailed closed-form expressions corroborated by MCsimulations. We are sure to have an important tool to guide developers inbuilding and analyzing low-frequency noise in semiconductor devices.

Estimating time constants of the RTS noise in semiconductor devices: a complete description of the observation window in the time domain