English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

We present the results of an experimental study of multiple scattering ofpositively charged high energy particles in bent samples of monocrystallinesilicon. This work confirms the recently discovered effect of a strongreduction in the rms multiple scattering angle of particles channeled in thesilicon (111) plane. The effect is observed in the plane orthogonal to thebending plane. We show in detail the influence of angular constraints on themagnitude of the effect. Comparison of the multiple scattering process atdifferent energies indicates a violation of the law of inverse proportionalityof the rms angle of channeled particles with energy. By increasing thestatistics, we have improved the results of multiple scattering measurementsfor particles moving, but not channeled, in silicon crystals.

Multiple scattering of channeled and non-channeled positively charged particles in bent monocrystalline silicon