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Fourier ptychographic microscopy (FPM) is a recently developed computationalimaging technique for wide-field, high-resolution microscopy with a highspace-bandwidth product. It integrates the concepts of synthetic aperture andphase retrieval to surpass the resolution limit imposed by the employedobjective lens. In the FPM framework, the position of each sub-spectrum needsto be accurately known to ensure the success of the phase retrieval process.Different from the conventional methods with mechanical adjustment ordata-driven optimization strategies, here we report a physics-based defocusingstrategy for correcting large-scale positional deviation of the LEDillumination in FPM. Based on a subpixel image registration process with adefocused object, we can directly infer the illumination parameters includingthe lateral offsets of the light source, the in-plane rotation angle of the LEDarray, and the distance between the sample and the LED board. The feasibilityand effectiveness of our method are validated with both simulation study andexperiments. We show that the reported strategy can obtain high-qualityreconstruction of both the complex object and pupil even the LED array israndomly placed under the sample with both unknown lateral offsets androtations. As such, it enables the development of robust FPM systems byreducing the requirement on fine mechanical adjustment and data-drivencorrection in the construction process.

Robust Fourier ptychographic microscopy via a physics-based defocusing strategy for calibrating angle-varied LED illumination