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Infrared (IR) nanospectroscopy by photothermal induced resonance (PTIR) is anovel experimental technique that combines the nanoscale resolution granted byatomic force microscopy (AFM) and the chemical labelling made possible by IRabsorption spectroscopy. While the technique has developed enormously over thelast decade from an experimental point of view, the theoretical modelling ofthe signal still varies significantly throughout the literature and misses asolid benchmark. Here, we report an analysis focused on the electromagnetic andthermal simulations of a PTIR experiment. Thanks to a control experiment wherethe signal is acquired as a function of the thickness of a polymer film and fordifferent tip geometries, we find clear evidence that the interface thermalresistances play a key role in the determination of the measured signal andshould therefore always be accounted for by any quantitative modelling.

Modelling photothermal induced resonance microscopy: the role of interface thermal resistances