English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructivetechnique for micro and trace multi-element analysis of materials. Conventionaltrials show that using laboratory assisted EDXRF measurements, one can obtainelemental detection limits in the range of {\mu}g/g to sub-{\mu}g/g level. Inthe present work a quantitative approach has been followed in attempting toexplore how is it possible to obtain elemental detection limit in the range ofng/g by using simple EDXRF excitation (45{\deg}- 45{\deg} geometry) instead ofusing total reflection X-ray fluorescence (TXRF) technique, which rendersrelatively superior detection limits for different elements. In order toaccomplish this, we recorded fluorescence spectrum from a standard referencesample (ICP-IV) in similar experimental conditions. The results show that usinga very small quantity of sample on top of a thin kapton foil with a thicknessranging between 25-50 {\mu}m, as a sample carrier, the EDXRF technique mayoffer comparable elemental detection limits in contrast to TXRF technique.

Labeling elemental detection sensitivities in part per billion range using conventional geometry synchrotron assisted EDXRF measurements