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Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imagingtechnique providing three dimensional mapping of microstructure and localstrain fields in deeply embedded crystalline elements. This is achieved byplacing an objective lens in the diffracted beam, giving a magnified projectionimage. So far, the method has been applied with a time resolution ofmilliseconds to hours. In this work, we consider the feasibility of DFXM at thepicosecond time scale using an X-ray free electron laser source and apump-probe scheme. We combine thermomechanical strain wave simulations withgeometrical optics and wavefront propagation optics to simulate DFXM images ofphonon dynamics in a diamond single crystal. Using the specifications of theXCS instrument at the Linac Coherent Light Source (LCLS) as an example resultsin simulated DFXM images clearly showing the propagation of a strain wave.

X-ray Free Electron Laser based Dark-Field X-ray Microscopy