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The VOXES collaboration at INFN National Laboratories of Frascati developed aprototype of a high resolution Von Hamos X-ray spectrometer using HAPG (HighlyAnnealed Pyrolytic Graphite) mosaic crystals. This technology allows theemployment of extended isotropic sources and could find application in severalphysics fields. The capability of the spectrometer to reach energy precisionand resolution below 1 and 10 eV, respectively, when used with wide sourceshave been already demonstrated. Recently, the response of this device, for a$\rho$ = 206.7 mm cylindrically bent HAPG crystal using $CuK\alpha_{1,2}$ and$FeK\alpha_{1,2}$ XRF lines, has been investigated in terms of reflectionefficiency by a dedicated ray-tracing simulation. Details of the simulationprocedure and the comparison with the experimental results are presented. Thisstudy is crucial in order to retrieve information on the spectrometer signalcollection efficiency, especially in the energy range in which the standardcalibration procedures cannot be applied.

Reflection efficiency and spectra resolutions ray-tracing simulations for the VOXES HAPG crystal based Von Hamos spectrometer