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Emergent phenomena at complex-oxide interfaces have become a vibrant field ofstudy in the past two decades due to the rich physics and a wide range ofpossibilities for creating new states of matter and novel functionalities forpotential devices. Electronic-structural characterization of such phenomenapresents a unique challenge due to the lack of direct yet non-destructivetechniques for probing buried layers and interfaces with the requiredAngstrom-level resolution, as well as element and orbital specificity. In thisreview article, we survey several recent studies wherein soft x-raystanding-wave photoelectron spectroscopy, a relatively newly developedtechnique, is used to investigate buried oxide interfaces exhibiting emergentphenomena such as metal-insulator transition, interfacial ferromagnetism, andtwo-dimensional electron gas. Advantages, challenges, and future applicationsof this methodology are also discussed.

Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy