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We introduce a weighted ellipse fitting routine to measure Debye Scherrerrings acquired on 2D area detectors and demonstrate its use in straindetermination. The method is relatively robust against incomplete rings due tolow number of grains in the diffraction volume (spotty rings), or strongtexture (intensity depletion in some azimuths). The method works by applying anannular mask around each diffraction ring and fitting an ellipse, using allpixel positions and their diffracted intensity as weights in the minimisation.We compare this method to the more popular cake integration method, and showthat the weighted ellipse method works when the cake integration method failsor works poorly. The lattice strain sensitivity from spotty diffraction ringsis in the order or 2E-5 or better. The algorithm has been made available forpublic use and works with 2D diffraction patterns acquired in a laboratoryscale XRD equipment, TEM or a synchrotron.

Weighted ellipse fitting routine for spotty or incomplete Debye-Scherrer rings on a 2D detector