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Copper oxide (CuO) thin films have been deposited on glass substrates by afacile sol-gel dip-coating technique with varying withdrawal speeds from 0.73to 4.17 mm/s. The variation of film thickness manifested by dip-coatingwithdrawal speeds was investigated in detail to investigate its effect on thestructural, morphological, optoelectrical, and wettability properties of CuOthin films for carbon dioxide (CO2) gas-sensing applications. Thecrystallinity, as well as phase purity of dip-coated CuO, were confirmed byboth X-ray diffraction (XRD) and Raman spectral analyses. The surfacemorphology of the films characterized by the scanning electron microscopy (SEM)revealed that pore density decreases with the increase of withdrawal speeds andgrain size is found to increase with the increase of film thicknesscorroborating the XRD results. The optical bandgap of dip-coated CuO films wasestimated in the range of 1.47 - 1.52 eV from the UV-VIS-NIR transmission dataand it is found to decrease with the increment of Urbach tail statesaccompanied by the increase of film thickness. The ratio of the electrical andoptical conductivity of CuO films is found to decrease with increasingwithdrawal speeds due to the variation of carrier concentration. Among all thestudied films, the sample deposited to a 0.73 mm/s withdrawal speed exhibitedthe highest crystallinity, porous morphology, highest pore density,optoelectrical conductivity as well as water contact angle, and thereforemaximum gas sensing response of CO2 vapor in the air recorded at roomtemperature.

Effects of withdrawal speeds on the structural, morphological,  electrical, and optical properties of CuO thin films synthesized by  dip-coating for CO2 gas sensing