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The aberrations induced by the sample and/or by the sample holder limit theresolution of optical microscopes. Wavefront correction can be achieved using adeformable mirror with wavefront sensorless optimization algorithms but,despite the complexity of these systems, the level of correction is oftenlimited to a small area in the field of view of the microscope. In this work,we present a plug and play module for aberration measurement and correction.The wavefront correction is performed through direct wavefront reconstructionusing the spinning-pupil aberration measurement and controlling a deformablelens in closed loop. The lens corrects the aberrations in the center of thefield of view, leaving residual aberrations at the margins, that are removed byanisoplanatic deconvolution. We present experimental results obtained influorescence microscopy, with a wide field and a light sheet fluorescencemicroscope. These results indicate that detection and correction over the fullfield of view can be achieved with a compact transmissive module placed in thedetection path of the fluorescence microscope.

Aberration measurement and correction on a large field of view in fluorescence microscopy