English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Exploring the limits of an Analog and Mixed Signal (AMS) circuit by drivingappropriate inputs has been a serious challenge to the industry. Doing anexhaustive search of the entire input state space is a time-consuming exerciseand the returns to efforts ratio is quite low. In order to meet time-to-marketrequirements, often suboptimal coverage results of an integrated circuit (IC)are leveraged. Additionally, no standards have been defined which can be usedto identify a target in the continuous state space of analog domain such thatthe searching algorithm can be guided with some heuristics. In this report, weelaborate on two approaches for tackling this challenge - one is based onfrequency domain analysis of the circuit, while the other applies the conceptof Bayesian optimization. We have also presented our results by applying thetwo approaches on an industrial LDO and a few AMS benchmark circuits.

Methodology for Biasing Random Simulation for Rapid Coverage of Corner Cases in AMS Designs