English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

In this work, an optic fiber based $\textit{in situ}$ illumination systemintegrated into an aberration-corrected environmental transmission electronmicroscope (ETEM) is designed, built, characterized and applied. With thisillumination system, the dynamic responses of photoactive materials to photonscan be directly observed at the atomic level, and other stimuli includingheating and various gases can also be applied simultaneously. Either abroadband light source or a high power laser source aiming to expeditephotoreactions can be utilized, fitting different application needs. The opticfiber enters the ETEM through the objective aperture port, with a carefullydesigned curvature and a 30{\deg} cut at the tip to orient the emitted lightupwards onto the TEM specimen. The intensity distributions striking the samplefrom the broadband and laser sources are both measured, and due to thenon-uniform distributions, an alignment procedure has been developed to alignthe bright spot with the electron optical axis of the TEM. The imaging andspectroscopy performances of the ETEM are proved to be maintained afterincorporating this illumination system. Furthermore, Langmuir evaporation isobserved when in situ laser light is applied to GaAs, demonstrating thephenomenon of optical heating on suitable semiconductor materials.

An $\textit{In Situ}$ Light Illumination System for an Aberration-Corrected Environmental Transmission Electron Microscope