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Modern optical microscopy methods have been advanced to provide superresolution at high imaging speed, but not chirality discriminative. We recentlyproposed chiral structured-illumination microscopy (SIM) method to image chiralfluorescent domains at sub-wavelength resolution. Chiral SIM is suitable forimaging chiral domains at sub-wavelength resolution but loses the high spatialfrequency of the achiral ones. In order to obtain the full picture of allfluorescent domains at sub-wavelength resolution, we propose an advancedversion of chiral SIM, termed double SIM, which enables simultaneous imaging ofachiral and chiral domains at sub-wavelength resolution. In double SIM, theillumination field must be spatially structured both in the intensity andoptical chirality so that moir\'e effects can be concurrently generated on theachiral and chiral fluorescent domains of a sample. This allows down-modulatingthe high spatial frequency of both domains at the same time and thus providessub-wavelength details after image reconstruction. To generate the illuminationfield with concurrently structured intensity and optical chirality, we proposeinterfering two coherent circularly polarized light with the same handedness atthe sample plane. We introduce the working principle of double SIM andtheoretically demonstrate the feasibility of this method using different kindsof synthetic samples.

Simultaneous Imaging Achiral and Chiral Domains beyond Diffraction Limit by Structured-illumination Microscopy