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The measurement of in-plane birefringence ($\Delta{n}$) of ultrathin film ischallenging due to a significant deviation of physical properties of materialsin ultrathin regime as compared to that in bulk state. Surface plasmonresonance (SPR) phenomenon can be employed to measure change in refractiveindex of ultrathin film at a very high resolution. This article discussessimulation of SPR phenomenon in Kretschmann configuration for the measurementof $\Delta{n}$ in organic thin film exhibiting nematic-like ordering on the twodimensional gold surface. The distribution of plasmonic field on the goldsurface was found to be anisotropic. This suggested that the coupling plasmonicfield with that of organic thin film exhibiting nematic-like ordering on thegold surface will be non-isotropic. Therefore, a non-zero difference inresonance angle (RA) was obtained from SPR measurement performed along theoptic-axis (OA) and orthogonal to OA of the in-plane nematic ordering($\Delta\theta$). A calibration surface showing the variation of($\Delta\theta$) as a function of $\Delta{n}$ and thickness of thin organicfilm consisting of shape anisotropic tilted molecules exhibiting nematic-likeordering on gold surface was obtained. This calibration surface was employedfor the measurement of $\Delta{n}$ of single layer of Langmuir-Blodgett filmsof cadmium stearate (CdSA) and 4'-octyl-4-biphenylcarbonitrile (8CB) depositedon SPR chips. The thickness of the LB films was estimated using X-rayreflectivity measurement and $\Delta\theta$ was measured using a home built SPRinstrument. The $\Delta{n}$ values were found to be 0.012 and 0.022 forultrathin films of CdSA and 8CB molecules, respectively.

Surface plasmon resonance for in-plane birefringence measurement of anisotropic thin organic film