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Defects are generally regarded to have negative impact on carrierrecombination, charge-transport and ion migration in perovskite materials,which thus lower the efficiency and stability of perovskite optoelectronicdevices. Meanwhile, lots of efforts which focused on minimizing defects havegreatly promoted the application of perovskite materials. Then, can defects bepositive in perovskite optoelectronic devices? Herein, relying on in-depthunderstanding of defect-associated effects in semiconductors, trapping ofphoto-generated carriers by defects is applied to enlarge photoconductive gainin perovskite photodetector. The record photoconductive gain, gain-bandwidthproduct and detection limit were achieved in the photodetector. Exceeding thegeneral concept that defects are harmful, we identify a new view that thedefects can be positive in perovskite optoelectronic devices.

Identifying and understanding the positive impact of defects for perovskites optoelectronic devices