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Single-shot laser-induced damage threshold (LIDT) measurements of multi-typefree-standing ultrathin foils were performed in vacuum environment for 800 nmlaser pulses with durations {\tau} ranging from 50 fs to 200 ps. Results showthat the laser damage threshold fluences (DTFs) of the ultrathin foils aresignificantly lower than those of corresponding bulk materials. Wide band gapdielectric targets such as SiN and formvar have larger DTFs than those ofsemiconductive and conductive targets by 1-3 orders of magnitude depending onthe pulse duration. The damage mechanisms for different types of targets arestudied. Based on the measurement, the constrain of the LIDTs on the lasercontrast is discussed.

Laser-induced damage thresholds of ultrathin targets and their constrain on laser contrast in laser-driven ion acceleration experiments