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Atomically thin materials such as graphene and semiconducting transitionmetal dichalcogenides have attracted extensive interest in recent years,motivating investigation into multiple properties. In this work, we used theopto thermal Raman technique to measure the thermal transport properties of apopular TMDC material WSe$_2$, in single atomic layer, bilayer, and trilayerforms.

Thermal Conductivities and Interfacial Thermal Conductance of 1- to 3-Layer WSe$_2$