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In previous work a different and powerful, analytical, technique was used toget data, such as the absolute atom concentration (AAC), specimen thicknessetc., from public domain boron nitride EELS spectrum collected under acollection semi-angle, $\beta$, less than the plasmon cutoff angle,$\theta_{c}$, but large relative to incident beam convergence, $\alpha$. Here,seeking for some completeness, another, numerical, technique usable togetherwith, also, $\beta < \theta_{c}$ is described in minute detail and applied todata obtained with $\beta/\alpha < 2$, so necessitating incident beamconvergence-related corrections. A lot of experimental physical parameters allfully relevant to one another are produced from a single EELS spectrum. Ofpublic domain silicon nitride, Si$_{3}$N$_{4}$, EELS spectrum used. Comparisonbetween results producible by the two $\beta<\theta_{c}$-related techniquesmade. Results range from parameters such as AAC, density, plasmon criticalvector, plasmon dispersion coefficient, Fermi energy to specimen thickness.Results were obtained using version 5 of eelsMicr program and compared withexisting results obtained using non EELS techniques.

Detailed Electron Energy Loss Spectroscopy (EELS) Microanalysis of Data  Collected Under Semi-Angle Less Than Both Plasmon Cutoff Angle and Incident  Beam Convergence Semi-Angle