English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Transmission electron microscopy at very low energy is a promising way toavoid damaging delicate biological samples with the incident electrons, a knownproblem in conventional transmission electron microscopy. For imaging in the0-30 eV range, we added a second electron source to a low energy electronmicroscopy (LEEM) setup, enabling imaging in both transmission and reflectionmode at nanometer (nm) resolution. The latter is experimentally demonstratedfor free-standing graphene. Exemplary eV-TEM micrographs of gold nanoparticlessuspended on graphene and of DNA origami rectangles on graphene oxide furtherestablish the capabilities of the technique. The long and short axes of the DNAorigami rectangles are discernable even after an hour of illumination with lowenergy electrons. In combination with recent developments in 2D membranes,allowing for versatile sample preparation, eV-TEM is paving the way todamage-free imaging of biological samples at nm resolution.

Complementary LEEM and eV-TEM for imaging and spectroscopy