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Accurately indexing pseudosymmetric materials has long proven challenging forelectron backscatter diffraction. The recent emergence of intensity-basedindexing approaches promises an enhanced ability to resolve pseudosymmetrycompared to traditional Hough-based indexing approaches. However, little workhas been done to understand the effects of sample position and orientation onthe ability to resolve pseudosymmetry, especially for intensity-based indexingapproaches. Thus, in this work we quantitatively investigate the effects ofcrystal orientation and detector distance in a model tetragonal ZrO2(c/a=1.0185) material. We identify orientations that are easiest and mostdifficult to correctly index, characterize the effect of detector distance onindexing confidence, and analyze these trends based on the appearance ofspecific zone axes in the diffraction patterns. Our findings also point to theclear benefit of shorter detector distances for resolving pseudosymmetry usingintensity-based indexing approaches.

Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction