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A flexible apparatus for calibration of the absolute flux at the focal planeof the X-ray Source of a Powder Diffractometer, based on a fast scintillatorcounter, is presented. The measured fluxes, depending on the high voltage onthe X-ray tube, were at the range 200 - 400 MHz, while an uncertainty in theflux of the order of 5% has been estimated. We also applied this calibrationfor radiation hardness study of a multichannel silicon microstrip X-Raydetector.

Calibration of X-Ray Source of a Powder Diffractometer and Radiation Test of Silicon Microstrip Detectors