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Epitaxial graphene grown on metallic substrates presents, in several cases, along-range periodic structure due to a lattice mismatch between the grapheneand the substrate. For instance, graphene grown on Ir(111), displays acorrugated supercell with distinct adsorption sites due to a variation of itslocal electronic structure. This type of surface reconstruction represents achallenging problem for a detailed atomic surface structure determination forexperimental and theoretical techniques. In this work, we revisited the surfacestructure determination of graphene on Ir(111) by using the unique advantage ofsurface and chemical selectivity of synchrotron-based photoelectrondiffraction. We take advantage of the Ir 4f photoemission surface state and useits diffraction signal as a probe to investigate the atomic arrangement of thegraphene topping layer. We determine the average height and the overallcorrugation of the graphene layer, which are respectively equal to 3.40 $\pm0.11 \AA$ and 0.45 $\pm 0.03 \AA$. Furthermore, we explore the graphenetopography in the vicinity of its high-symmetry adsorption sites and show thatthe experimental data can be described by three reduced systems simplifying theMoir\'{e} supercell multiple scattering analysis.

Selecting "Convenient Observers" to Probe the Atomic Structure of Epitaxial Graphene Grown on Ir(111) via Photoelectron Diffraction