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We have studied the amorphization process of SnI4 up to 26.8GPa withunprecedented experimental details by combining Sn and I K edge X-rayabsorption spectroscopy and powder X-ray diffraction. Standards and reverseMonte Carlo extended X-ray absorption fine structure (EXAFS) refinementsconfirm that the SnI4 tetrahedron is a fundamental structural unit that ispreserved through the crystalline phase-I to crystalline phase-II transitionabout 7 to 10GPa and then in the amorphous phase that appears above 20GPa. Upto now unexploited Iodine EXAFS reveals to be extremely informative andconfirms the formation of iodine iodine short bonds close to 2.85{\AA} in theamorphous phase at 26.8 GPa. A coordination number increase of Sn in thecrystalline phase-II appears to be excluded, while the deformation of thetetrahedral units proceeds through a flattening that keeps the average I-Sn-Iangle close to 109.5{\deg}. Moreover, we put in evidence the impact of pressureon the Sn near edge structure under competing geometrical and electroniceffects.

Mechanism of pressure induced amorphization of SnI4: a combined X-ray diffraction -- X-ray absorption spectroscopy study