English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

In the Reverse Engineering and Hardware Assurance domain, a majority of thedata acquisition is done through electron microscopy techniques such asScanning Electron Microscopy (SEM). However, unlike its counterparts in opticalimaging, only a limited number of techniques are available to enhance andextract information from the raw SEM images. In this paper, we introduce analgorithm to segment out Integrated Circuit (IC) structures from the SEM image.Unlike existing algorithms discussed in this paper, this algorithm isunsupervised, parameter-free and does not require prior information on thenoise model or features in the target image making it effective in low qualityimage acquisition scenarios as well. Furthermore, the results from theapplication of the algorithm on various structures and layers in the IC arereported and discussed.

Histogram-based Auto Segmentation: A Novel Approach to Segmenting Integrated Circuit Structures from SEM Images