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Novel analog-to-digital converter (ADC) architectures are motivated by thedemand for rising sampling rates and effective number of bits (ENOB). The mainlimitation on ENOB in purely electrical ADCs lies in the relatively high jitterof oscillators, in the order of a few tens of fs for state-of-the-artcomponents. When compared to the extremely low jitter obtained withbest-in-class Ti:sapphire mode-locked lasers (MLL), in the attosecond range, itis apparent that a mixed electrical-optical architecture could significantlyimprove the converters' ENOB. We model and analyze the ENOB limitations arisingfrom optical sources in optically enabled, spectrally sliced ADCs, afterdiscussing the system architecture and implementation details. The phase noiseof the optical carrier, serving for electro-optic signal transduction, is shownnot to propagate to the reconstructed digitized signal and therefore not torepresent a fundamental limit. The optical phase noise of the MLL used togenerate reference tones for individual slices also does not fundamentallyimpact the converted signal, so long as it remains correlated among all thecomb lines. On the other hand, the timing jitter of the MLL, as also reflectedin its RF linewidth, is fundamentally limiting the ADC performance, since it isdirectly mapped as jitter to the converted signal. The hybrid nature of aphotonically enabled, spectrally sliced ADC implies the utilization of a numberof reduced bandwidth electrical ADCs to convert parallel slices, resulting inthe propagation of jitter from the electrical oscillator supplying their clock.Due to the reduced sampling rate of the electrical ADCs, as compared to theoverall system, the overall noise performance of the presented architecture issubstantially improved with respect to a fully electrical ADC.

Mode-locked laser timing jitter limitation in optically enabled, spectrally sliced ADCs