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To recognize sub-micron range low energy tracks recorded in a super finegrained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting methodwas devised to analyze anisotropic images taken by an optical microscope. Inthis paper, we will report on this newly developed method using discreteFourier transform and second-order moment analysis of the brightnessdistribution. We succeeded in lowering the ellipticity threshold, therebyimproving the detection efficiency and angular resolution. Notably, the successof detecting carbon 30 keV tracks is the first such achievement in the world,where the incident direction of carbon 30 keV ions was determined with anaccuracy of 41 degree and an efficiency of 1.7%.

Optical shape analysis based on discrete Fourier transform and second  order moment calculation of the brightness distribution for the detection of  sub-micron range low energy tracks