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Electron spectrometry is traditionally challenging due to the difficulty ofcorrectly reconstructing the original energy of the detected electrons. SiliconDrift Detectors, extensively used for X-ray spectrometry, are a promisingtechnology for the precise measurement of electrons energy. The ability tocorrectly model the detector entrance window response to the energy depositedby electrons is a critical aspect of this application. We hereby describe aMonteCarlo-based approach to this problem, together with characterization andvalidation measurements performed with electron beams from a Scanning ElectronMicroscope.

Electron spectrometry with SDDs: a GEANT4 based method for detector response reconstruction