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We present a thorough analysis of the foundations of models of stabilizationof negative capacitance (NC) in a ferroelectric (FE) layer by capacitancematching to a dielectric layer, which claim that the FE is stabilized in a lowpolarization state without FE polarization switching (non-switching), showingthat the concept is fundamentally flawed and unphysical. We also analyzeexperimental evidence concluding that there is no data supporting the need toinvoke such stabilization; rather, conventional models of ferroelectricpolarization switching suffice to account for the effects observed. We analyzeexperimental evidence that at least in some of the model systems for which thiseffect has been claimed, categorically rule out stabilized non-switching NC.Microscopic measurements recently published as supporting non-switchingstabilized NC actually rule them out, since the ferroelectric in a stacksandwiched between two dielectric layers was found to be in a mixed domainstate (high polarizations within each domain) rather than in the lowpolarization state predicted by non-switching stabilized NC models.Nonetheless, since stabilized NC (corresponding to a minimum in free energy) isnot physically impossible, it would be useful to move the research efforts toinvestigating scenarios and systems in which this effect is possible andexpected and assess whether they are useful and practical for low powerelectronics.

A critical analysis of models and experimental evidence of negative  capacitance stabilization in a ferroelectric by capacitance matching to an  adjacent dielectric layer