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Extending our prior work, we propose a multi-energy X-ray measurement modelincorporating material variability with energy correlations to enable theanalysis and exploration of the performance of X-ray imaging and sensingsystems. Based on this measurement model, we provide analytical expressions forbounds on the probability of error, $P_e$, to quantify the performance limitsof an X-ray measurement system for binary classification task. We analyze theperformance of a prototypical X-ray measurement system to demonstrate theutility of our proposed material variability measurement model.

X-ray measurement model incorporating energy-correlated material variability and its application in information-theoretic system analysis