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Polycrystalline samples of CuCrO2 were synthesized by solid state reactionmethod. Temperature dependent dielectric measurements, synchrotron x-raydiffraction (SXRD), pyroelectric current and Raman measurements have beenperformed on these samples. Evidences of the presence of relaxor typeferroelectricity, which otherwise have gone unnoticed in CuCrO2 system (amember of delafossite family) near room temperature, have been presented.Presence of broad maximum in dielectric permittivity and its frequencydispersion indicates relaxor-type ferroelectricity in CuCrO2 near roomtemperature. Careful analysis of temperature dependent SXRD data and Ramanspectroscopic data indicates that the distorted CrO6 octahdera, is giving riseto strain in the sample. Due to this strain, polar regions are forming in anotherwise non-polar matrix, which is giving rise to relaxor typeferroelectricity in the sample. Regularization of CrO6 octahedra anddisappearance of disorder induced peak in Raman spectra at high temperaturescould be the reason behind observed dielectric anomaly in this sample. Presentinvestigations propose that relaxor type ferroelectricity near room temperatureis an inherent property of the CuCrO2 system, making it a fascinating materialto be explored further.

Strain Induced Relaxor-type Ferroelectricity Near Room Temperature in Delafossite CuCrO2