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Controlling the wavefront of an extreme ultraviolet (XUV) high-order harmonicbeam during the generation process offers to focus the beam without resortingto any XUV optics. By characterizing the XUV intensity profile and wavefront,we quantitatively retrieve both the size and the position of the waist of eachgenerated harmonics and show that optics-free focusing leads to focused XUVspot with micrometer size. We use this remarkable coherent effect todemonstrate efficient and adjustable spectral filtering of the XUV light, alongwith a strong rejection of the fundamental beam, without using any XUV optics.

Optics-free focusing down to micrometer spot size and spectral filtering of XUV harmonics