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We introduce optical polarization-insensitive high pass filters based ontotal internal reflection of light at the interface of two dielectric media(1D) and Bragg reflection of a multilayer stack (2D) in transmission mode. Thewavevectors in the stopband become coupled to evanescent waves in our design,rather than the zero of a narrow-band resonant mode. This provides remarkableresolution enhancement for edge detection applications. Rigorous analysis basedon plane wave expansion is carried out and the results are verified byfull-wave numerical simulation. Also for the case of multilayer structure, thethickness of layers is tuned using an optimization algorithm to represent abetter approximation of an ideal high pass filter. The application of thedesigned high pass filters for edge detection of input field profiles isdemonstrated for both 1D and 2D operations. The proposed devices are compactand no Fourier lens is required, since the operator is directly implemented inthe spatial Fourier domain.

Analog Optical Implementation of Spatial High Pass Filtering Using Evanescent Waves