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Reflectometry is a technique that uses the light reflected by a sample todetermine properties of the sample. Interferometric reflectometry usesinterference between two beams, one of which is incident on ---and reflectedback by--- a sample and one of which is not, to obtain the complex electricfield rather than merely its intensity. Since this interference allows one toretrieve an increased amount of information about the light, it also allows oneto obtain more information about the sample, such as a thin layer. We willapply the methods derived here to the case of a planar lipid bilayer.

A model for the complex reflection coefficient of a collection of parallel layers