English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

In applications of scanning probe microscopy, images are acquired by rasterscanning a point probe across a sample. Viewed from the perspective ofcompressed sensing (CS), this pointwise sampling scheme is inefficient,especially when the target image is structured. While replacing pointmeasurements with delocalized, incoherent measurements has the potential toyield order-of-magnitude improvements in scan time, implementing thedelocalized measurements of CS theory is challenging. In this paper we study apartially delocalized probe construction, in which the point probe is replacedwith a continuous line, creating a sensor which essentially acquires lineintegrals of the target image. We show through simulations, rudimentarytheoretical analysis, and experiments, that these line measurements can imagesparse samples far more efficiently than traditional point measurements,provided the local features in the sample are enough separated. Despite thispromise, practical reconstruction from line measurements poses additionaldifficulties: the measurements are partially coherent, and real measurementsexhibit nonidealities. We show how to overcome these limitations using naturalstrategies (reweighting to cope with coherence, blind calibration fornonidealities), culminating in an end-to-end demonstration.

Compressed Sensing Microscopy with Scanning Line Probes