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Exploring and controlling the physical factors that determine the topographyof thin liquid dielectric films are of interest in manifold fields of researchin physics, applied mathematics, and engineering and have been a key aspect ofmany technological advancements. Visualization of thin liquid dielectric filmtopography and local thickness measurements are essential tools forcharacterizing and interpreting the underlying processes. However, achievinghigh sensitivity with respect to subnanometric changes in thickness viastandard optical methods is challenging. We propose a combined imaging andoptical patterning projection platform that is capable of optically inducingdynamical flows in thin liquid dielectric films and plasmonically resolving theresulting changes in topography and thickness. In particular, we employ thethermocapillary effect in fluids as a novel heat-based method to tune plasmonicresonances and visualize dynamical processes in thin liquid dielectric films.The presented results indicate that light-induced thermocapillary flows canform and translate droplets and create indentation patterns on demand in thinliquid dielectric films of subwavelength thickness and that plasmonicmicroscopy can image these fluid dynamical processes with a subnanometersensitivity along the vertical direction.

Subnanometer imaging and controlled dynamical patterning of thermocapillary driven deformation of thin liquid films