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Background: Nanoscale composition of silk defining its unique properties viaa hierarchical structural anisotropy has to be analysed at the highest spatialresolution of tens-of-nanometers corresponding to the size of fibrils made ofb-sheets, which are the crystalline building blocks of silk. Results: Nanoscaleoptical and structural properties of silk have been measured from 100-nm thicklongitudinal slices of silk fibers with ~10 nm resolution, the highest so far.Optical sub-wavelength resolution in hyperspectral mapping of absorbance andmolecular orientation were carried out for comparison at IR wavelengths 2-10micrometers using synchrotron radiation. Conclusion: Reliable distinction oftransmission changes by only 1-2% due to anisotropy of amide bands was obtainedfrom nano-thin slices of silk.

Nanoscale optical and structural characterisation of silk