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X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thinfilms grown by pulsed laser deposition (PLD) are presented. The films contain${\beta}$-FeSe and Fe$_7$Se$_8$ phases in a double epitaxy configuration withthe ${\beta}$-FeSe phase (001) oriented on the (001) MgO growth substrate.Fe$_7$Se$_8$ simultaneously takes on two different epitaxial orientations incertain growth conditions, exhibiting both (101)- and (001)- orientations. Eachof these orientations are verified with the presented XRD data. Additionally,XRD data used to determine the PLD target composition as well as mosaicstructure of the ${\beta}$-FeSe phase are shown.

X-ray diffraction analysis to support phase identification in FeSe and Fe$_7$Se$_8$ epitaxial thin films