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We provide integral formulae for the Laplace transform of the entrance law ofthe reflected excursions for symmetric L\'evy processes in terms of theircharacteristic exponent. For subordinate Brownian motions and stable processeswe express the density of the entrance law in terms of the generalizedeigenfunctions for the semigroup of the process killed when exiting thepositive half-line. We use the formulae to study in-depth properties of thedensity of the entrance law such as asymptotic behavior of its derivatives intime variable.

The entrance law of the excursion measure of the reflected process for some classes of L\'evy processes