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In cryogenic two phase flow, it is always challenging to measure the qualityand void fraction. In this regard, an effort has been made to indigenouslydevelop an electronic circuit to measure the void fraction by measuring thecapacitance of the order of picofarads accurately depending upon the dielectricconstant of nitrogen in vapor and liquid phase. The state-of-art electronicscard has been developed and tested successfully for its performance andvalidation. Using this card, an experiment has been conducted using liquidnitrogen cryo transfer line to study the two phase void fraction. In thispaper, the design basis and working principle of the designed electronics cardalong with the performance results are discussed. A/D conversion and DAQ systemhas been implemented to display the direct measurement data in a computer.

Development of Precise Low Value Capacitance Measurement System for Cryogenics Two Phase Flow Application