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We report the field emission (FE) properties of Cu coated vertically alignedcarbon nanotubes (VACNTs) before and after oxidation. The current density wasfound to be the maximum (20 mA/cm$^2$) for 3 nm thick Cu coated VACNTs afteroxidation. The variation in conventionally monitored parameters like workfunction and field enhancement factor does not explain the experimentallydetermined FE current density. A critical analysis of the electronic structurereveals the importance of presence of Cu$_2$O at the interface of CuO andVACNTs, which in turn controls the current density of these films. The highlyenhanced FE current density of 3 nm Cu coated VACNTs after oxidation suggestsits potential as a next generation electron source in vacuum microelectronicdevices.

Highly enhanced field emission current density of copper oxide coated  vertically aligned carbon nanotubes: Role of interface and electronic  structure