English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Atomically thin two-dimensional (2D) materials provide a wide range of basicbuilding blocks with unique properties, making them ideal for heterogeneousintegration with a mature chip platform for advances in optical communicationtechnology. Control and understanding of the precise value of the optical indexof these materials, however, is challenging, due to the small lateral flakedimension. Here we demonstrate a semi-empirical method to determine the indexof a 2D material (nMoTe2 of 4.36+0.011i) near telecommunication-relevantwavelength by integrating few layers of MoTe2 onto a micro-ring resonator. Theplacement, control, and optical-property understanding of 2D materials withintegrated photonics paves a way for further studies of active 2Dmaterial-based optoelectronics and circuits.

A semi-empirical integrated microring cavity approach for 2D material optical index identification at 1.55 {\mu}m